ASIC IC Design for Test Process Guide Software Version 8 6 1 December 1997 Mentor rd PAIS G Copyright Mentor Graphics Corporation 1991 1997 All rights reserved This document contains information that is proprietary to Mentor Graphics Corporation and may be duplicated in whole or in part by the original recipient for internal business purposes only provided that this entire notice appears in all copies In accepting this document the recipient agrees to mak
ASIC IC Debugging and Troubleshooting sub micron probe station At DELTA we have the competences and powerful tools to assist you in revealing why the ASIC IC design does not work and locate the failure site Possible causes of failure are ESD handling dama ges ASIC IC design errors or bad wafer processing Services IC debugging Hot spot analysis Line probing Line cuts isolate circuits Leak current detection Leak current measurements Probing Probing o