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1. Semiconductor Characterization System

4200 SCS Intuitive point and click Windows based environment Unique Remote PreAmps extend the resolution of SMUs to 0 1fA C V instrument makes C V measurements as easy as DC I V Pulse and pulse I V capabilities for advanced semiconductor testing Scope card provides integrated scope and pulse measure functionality Self contained PC provides fast test setup powerful data analysis graphing and printing and on board mass storage of test results Unique brows
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